IEEE Transactions on Electron Devices · 1991 · 288 citations · 8 references
EngineeringElectrical EngineeringCircuit TheoryMicroelectronicsSemiconductor DevicesCurrent-voltage CharacteristicsDevice CharacterizationDevice ModelingDevice SimulationIntegrated Circuit DesignShort-channel EffectsCircuit ModelingCompact Device ModelingCompact ModelingElectric Circuit ModelsMetal-oxide-semiconductor Field-effect Transistor ModelingMosfet ModelingParameter ExtractionPower-law Model
A simple, general, yet realistic MOSFET model, the nth power law MOSFET model, is introduced. The model can express I-V characteristics of short-channel MOSFETs at least down to 0.25- mu m channel length and of resistance inserted MOSFETs. The model evaluation time is about 1/3 of the evaluation time of the SPICE3 MOS LEVEL3 model. The model parameter extraction is done by solving single variable equations and thus can be done within a second, unlike the fitting procedure with expensive numerical iterations used for the conventional models. The model also permits analytical treatment of circuits in the short-channel region and plays the role of a bridge between complicated MOSFET current characteristics and circuit behavior in the deep-submicrometer region.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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William H. Press, Saul A. Teukolsky, William T. Vetterling et al. · 1994 · 15.4K citations
A Unipolar "Field-Effect" Transistor
W. Shockley · Proceedings of the IRE · 1952 · 659 citations
GaAs FET device and circuit simulation in SPICE
H. Statz, P. G. Newman, I. W. Smith et al. · IEEE Transactions on Electron Devices · 1987 · 518 citations