Optics Express · 2010 · 89 citations · 18 references
EngineeringMaterials EngineeringMaterials ScienceNanotechnologyOptoelectronicsPhotonicsNanoimprint LithographyPhotodetectorsSemiconductor NanomaterialsSilicon PhotonicsThin Film Optical PropertiesUltraviolet DetectorsDeep Ultraviolet LithographySilicon PhotodetectorsSilicon PhotodiodesSolar-blind DetectorsUltraviolet Filter DesignUltraviolet Solar RadiationUv Nanoimprint LithographyWavelength Tuning
We designed, fabricated and demonstrated a solar-blind deep-UV pass filter, that has a measured optical performance of a 27% transmission peak at 290 nm, a pass-band width of 100 nm (from 250 to 350 nm), and a 20dB rejection ratio between deep-UV wavelength and visible wavelength. The filter consists of an aluminum nano-grid, which was made by coating 20 nm Al on a SiO(2) square grid with 190 nm pitch, 30 nm linewidth and 250 nm depth. The performances agree with a rigorous coupled wave analysis. The wavelength for the peak transmission and the pass-bandwidth can be tuned through adjusting the metal nano-grid dimensions. The filter was fabricated by nanoimprint lithography, hence is large area and low cost. Combining with Si photodetectors, the filter offers simple yet effective and low cost solar-blind deep-UV detection at either a single device or large-area complex integrated imaging array level.
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Solution-Processed Ultraviolet Photodetectors Based on Colloidal ZnO Nanoparticles
Yizheng Jin, Jianpu Wang, Baoquan Sun et al. · Nano Letters · 2008 · 780 citations
Color filter based on a subwavelength patterned metal grating
Hong Sik Lee, Yeo-Taek Yoon, Sang‐Shin Lee et al. · Optics Express · 2007 · 234 citations · Full text
Natural Sciences, Electrical Engineering, Materials Science +15