Analysis of polymer surfaces by SIMS. 2—fingerprint spectra from simple polymer films

Abstract

Abstract Seven polymers (low density polyethylene, polypropylene, polystyrene, polymethylmethacrylate, poly(methacrylic acid), Nylon‐6 and poly(ethyleneterephthalate)) have been studied by SIMS. Very good signal: noise spectra up to mass 250 have been obtained using low damage conditions (i.e. ion current densities ∽1 nA cm −2 ) and electron beam charge neutralization. The spectra are highly characteristic and fairly easily interpreted using fragmentation data from electron impact mass spectrometry.