A two-dimensional analytical subthreshold behavior analysis including hot-carrier effect for nanoscale Gate Stack Gate All Around (GASGAA) MOSFETs - Concepedia

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A two-dimensional analytical subthreshold behavior analysis including hot-carrier effect for nanoscale Gate Stack Gate All Around (GASGAA) MOSFETs

41

Citations

12

References

2010

Year

M.A. Abdi, F. Djeffal, Zohir Dibi, D. Arar

Journal of Computational Electronics

Device ModelingElectrical EngineeringHot-carrier EffectEngineeringNanoelectronicsBias Temperature InstabilityApplied PhysicsMicroelectronicsSemiconductor Device

References

	Year	Citations

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