Publication | Closed Access
In situ TEM studies of oxygen vacancy migration for electrically induced resistance change effect in cerium oxides
119
Citations
30
References
2009
Year
Materials ScienceElectrical EngineeringEngineeringOxidation ResistanceOxide ElectronicsApplied PhysicsOxygen Vacancy MigrationGallium OxideSitu Tem StudiesCerium OxidesVacuum DeviceCermet
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