IEEE Photonics Technology Letters · 1999 · 153 citations · 12 references
EngineeringElectrical EngineeringMaterials ScienceOptoelectronicsPhotonicsSemiconductor DevicesDetector TechnologyHigh-frequency Semiconductor DevicesNoise In Semiconductor DevicesPhotodetectorsSemiconductor DetectorsWide Band Gap SemiconductorsAvalanche MultiplicationAvalanche Photodiode DetectorsAvalanche PhotodiodesBandwidthGain BandwidthGain-bandwidth ProductNoise CharacteristicsPhotodetector Noise Performance
We demonstrated a high-speed, resonant-cavity InGaAs-InAlAs separate absorption, charge, and multiplication avalanche photodiode (APD) operating at a wavelength of 1.55 μm. Due to the resonant-cavity scheme, these APDs exhibit high external quantum efficiency (/spl sim/70%) and a high unity-gain bandwidth of 24 GHz. Utilizing the excellent noise characteristics of a thin InAlAs multiplication region (k/spl sim/0.18), we have also achieved a gain-bandwidth product of 290 GHz. These bandwidth results are believed to be the highest reported values for APDs operating at 1.55 μm.
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Resonant cavity-enhanced (RCE) photodetectors
Katsumi Kishino, M. Selim Ünlü, Jen‐Inn Chyi et al. · IEEE Journal of Quantum Electronics · 1991 · 344 citations
Thin multiplication region InAlAs homojunction avalanche photodiodes
C. Lenox, Peng Yuan, Hui Nie et al. · Applied Physics Letters · 1998 · 88 citations