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A high performance low complexity SiGe HBT for BiCMOS integration

28

Citations

2

References

2002

Year

Abstract

A low complexity 0.35 /spl mu/m SiGe HBT technology, using a quasi self-aligned emitter/base structure on a non-selective Si/SiGe epitaxial base, is described. Excellent high frequency performances (f/sub max/ up to 71 GHz) are obtained, opening the way to a highly manufacturable SiGe BiCMOS technology.

References

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