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An a-Si:H/a-Si,Ge:H bulk barrier phototransistor with a-SiC:H barrier enhancement layer for high-gain IR optical detector
31
Citations
14
References
1993
Year
Optical MaterialsBulk BarrierEngineeringOptoelectronic DevicesIntegrated CircuitsSilicon On InsulatorSemiconductor DeviceSemiconductorsPhotodetectorsOptical PropertiesBulk Barrier PhototransistorBarrier PhototransistorCompound SemiconductorPhotonicsElectrical EngineeringPhysicsOptoelectronic MaterialsPhotoelectric MeasurementSemiconductor Device FabricationInfrared SensorHigh DarkApplied PhysicsOptoelectronics
The design and fabrication of a high-gain amorphous silicon/amorphous silicon germanium (a-Si:H/a-Si,Ge:H) bulk barrier phototransistor for infrared light detection applications are reported. The a-Si,Ge:H material featured a lower energy gap and is suitable for the absorption of longer wave light, but it also leads to a low breakdown voltage and high dark current. An additional a-SiC:H thin-film layer was used at the collector/base interface in the conventional amorphous bulk barrier phototransistor to enhance the function of the bulk barrier and obtain high optical gain.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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