Suppression of molecular ions in the secondary ion mass spectra of minerals

Abstract

Abstract A new approach to the suppression of molecular ions in secondary ion mass spectra of insulating specimens is reported. Using a Cameca IMS 3f instrument, with unconventional primary beam conditions and uncoated samples, it has been possible to almost eliminate the contribution of molecular ions to the mass spectrum. This has resulted in excellent discrimination for major and trace element detection in these materials, including complete resolution of the rare earth elements in a number of minerals.