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Residual stress and microstructure of as-deposited and annealed, sputtered yttria-stabilized zirconia thin films
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Citations
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References
2008
Year
Materials ScienceMaterial AnalysisEngineeringOxide ElectronicsApplied PhysicsResidual StressThin FilmsChemical Vapor DepositionThin Film Processing
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2001 | 7.6K | |
1909 | 4.8K | |
1975 | 2.2K | |
1978 | 968 | |
1999 | 639 | |
1992 | 631 | |
1988 | 598 | |
2000 | 547 | |
1996 | 492 | |
2001 | 442 |
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