Uncertainty of VNA S-Parameter Measurement Due to Nonideal TRL Calibration Items

Abstract

For the 7-term TRL calibration of a four-sampler vector network analyzer (VNA), expressions for the deviations of the S-parameters of two-port test objects are presented as functions of the deviations from the ideal values of the S-parameters of the TRL standards used. The sensitivity coefficients obtained are suitable for establishing the Type-B uncertainty budget for the S-parameter measurement.