Low‐Temperature In Situ Large‐Strain Plasticity of Silicon Nanowires

Abstract

The large-strain plasticity (LSP) of single-crystalline silicon nanowires (Si NWs) observed in situ at room temperature by axial tension experiments carried out in an ultrahigh-resolution electron microscope is reported. The LSP is demonstrated to result in a fourfold reduction in NW diameter before fracture (see figure), which is three orders of magnitude higher than that of bulk Si. Supporting information for this article is available on the WWW under http://www.wiley-vch.de/contents/jc_2089/2007/c2705_s.pdf or from the author. Please note: The publisher is not responsible for the content or functionality of any supporting information supplied by the authors. Any queries (other than missing content) should be directed to the corresponding author for the article.