Low‐Temperature In Situ Large‐Strain Plasticity of Silicon Nanowires

Abstract

The large-strain plasticity (LSP) of single-crystalline silicon nanowires (Si NWs) observed in situ at room temperature by axial tension experiments carried out in an ultrahigh-resolution electron microscope is reported. The LSP is demonstrated to result in a fourfold reduction in NW diameter before fracture (see figure), which is three orders of magnitude higher than that of bulk Si.