Linearized amplitude variation with offset (AVO) inversion with supercritical angles

Abstract

Abstract Contrary to popular belief, a linearized approximation of the Zoeppritz equations may be used to estimate the reflection coefficient for angles of incidence up to and beyond the critical angle. These supercritical reflection coefficients are complex, implying a phase variation with offset in addition to amplitude variation with offset (AVO). This linearized approximation is then used as the basis for an AVO waveform inversion. By incorporating this new approximation, wider offset and angle data may be incorporated in the AVO inversion, helping to stabilize the problem and leading to more accurate estimates of reflectivity, including density reflectivity.