IEEE Transactions on Electron Devices · 1984 · 45 citations · 6 references
Natural SciencesElectrical EngineeringMaterials ScienceElectromagneticsElectronic MaterialsMicroelectronicsDielectric CeramicsDielectric MaterialsDielectric PropertiesDielectric ResponseDielectricsDisplay TechnologiesArtificial DielectricsDielectric CharacterizationDielectric ConstantDielectric FunctionDielectric PermittivityHigh-permittivity MaterialsLow-dielectric-constant MaterialsOxide Dielectrics
The commonly used dielectrics, Y <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf> O <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</inf> , Al <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf> O <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</inf> , Si <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</inf> N <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">4</inf> , and Ta <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf> O <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">5</inf> , were evaluated for use in ac thin-film electroluminescent displays, along with a composite dielectric SiAlON. Adhesion, stress cracking, charge storage capacity, and display brightness and efficiency were studied for devices with ZnS: Mn layers fabricated under identical conditions. A combination of SiAlON and Ta <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf> O <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">5</inf> appears to be optimum as a double-layer dielectric system for ACTFEL displays.
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