IEEE Microwave and Guided Wave Letters · 1995 · 47 citations · 8 references
EngineeringElectrical EngineeringHeat TransferMicroelectronicsMicrowave EngineeringMicrowave MeasurementsMicrowave Noise AnalysisMicrowave OscillatorsMicrowave ResonatorsNoise In Electronic DevicesOscillatorsFlickerFlicker NoiseFrequency DriftFrequency StabilityLow-phase-noise OscillatorsOscillator Noise AnalysisPhase NoiseResonator Frequency Stability
The authors report on an X-band microwave oscillator incorporating a room temperature thermoelectric stabilized sapphire resonator operating at 9.00000 GHz. With a Galani type stabilization scheme they have measured a reduced single sideband phase noise of about -124 dBc/Hz at 1 kHz with a f/sup -3/ dependence. The measurement was limited by the flicker noise of the phase detector in the feedback electronics. The frequency stability was also measured; at an integration time of 0.1 seconds a /spl delta/f/f of about 10/sup -11/ with a /spl tau//sup 0.7/ dependence was measured. The frequency drift strongly correlated with ambient temperature fluctuations.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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