Combination of the failure probability with a random angle of incidence of the radiated interference

Abstract

Electronic devices exposed to high level electromagnetic interference with certain amplitude will fail with a certain probability. Knowing this failure probability is essential when a system is being designed to withstand intentional electromagnetic interference (IEMI). Based on this knowledge additional redundancy can be included in order to reduce the risk. In previous investigations [1] failure probability was analyzed for the case where a device was illuminated from one direction only. If the device is illuminated from other (random) directions, then the failure probability will change. In this contribution it is discussed how the failure probability determined for one direction can be extended in order to include a random angle of incidence of the interference. The main focus of this contribution is on failure probability caused by pulsed wideband signals. However, the approach presented here can also be extended to narrowband signals.