Cross correlation residual phase noise measurements using two HP3048A systems and a PC based dual channel FFT spectrum analyser

Abstract

This paper describes a cross correlation residual phase noise measurement system based on two HP3048A systems and a dual channel FFT spectrum analyser consisting of a PC card containing two 16bit (125MS/Sec) A to D converters. A measurement system noise floor of -200 dBc/Hz is achieved for 100,000 correlations. Residual phase noise measurements are also performed on low noise L-Band microwave amplifiers, developed at York. The key features of the cross correlation technique and the different window functions required during measurement are discussed.