Use of light-ion-induced SEU in devices under reduced bias to evaluate their SEU cross section

Abstract

Single-event upset (SEU) cross section was measured for several devices under reduced bias with light ions, in particular /spl alpha/-particles. The results show that /spl alpha/-particles can be used, in a simple manner, for testing devices in order to save accelerator time. A proportionality law was found for scaling the reduced bias results to normal operation bias.