Publication | Open Access
Novel area-time efficient static CMOS totally self-checking comparator
46
Citations
10
References
1993
Year
Hardware SecurityError DetectionSingle FaultEngineeringConcurrent Error DetectionSelf-checking ComparatorFault AnalysisComputer EngineeringComputer ArchitectureFormal MethodsBuilt-in Self-testHardware SystemsComputer ScienceDigital Circuit DesignFormal VerificationFault InjectionAsynchronous Circuits
The comparator is an essential element in concurrent error detection (CED). To ensure the correctness of error detection processes, comparators must be totally self-checking (TSC): any single fault occurring in the comparator must be detected by at least one normal input pattern, and before the detection of that fault, no erroneous output must be guaranteed. An area-time efficient static CMOS TSC comparator design is presented. This comparator uses only eight transistors and is totally self-checking with respect to stuck-at, stuck-open, stuck-on, bridging faults, and breaks.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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