Publication | Closed Access
Microprocessors functional testing techniques
16
Citations
5
References
1989
Year
EngineeringWhole InstructionComputational TestingProgram AnalysisDesign For TestingSoftware TestingComputer ArchitectureComputer EngineeringSoftware EngineeringMinimum SetComputer ScienceSoftware AnalysisSystem SoftwareInstruction-level ParallelismFormal VerificationFunctional Testing
The authors address the functional testing of microprocessors. A method is introduced for obtaining a minimum set of instructions that replaces the whole instruction set during testing procedure. The method is illustrated on the digital signal processor TM32010.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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