IEEE Transactions on Electron Devices · 2011 · 78 citations · 39 references
EngineeringMaterials EngineeringMaterials ScienceNanomaterialsNanotechnologySemiconductor DevicesMemory DevicesMetal Oxide NanomaterialsNanoelectronicsNanowiresSemiconductor NanomaterialsTransmission Electron MicroscopyNanoelectronic Memory DevicesOxide NanowiresResistive SwitchingSelected Area Electron DiffractionSemiconductor NanowiresSwitching BehaviorVacanciesZinc Oxide Nanostructures
Single-ZnO-nanowire (NW) memory based on resistive switching is demonstrated for the first time. The NW memory is stable, rewritable, and nonvolatile with on/off ratio up to 7.7 × 10 <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">5</sup> . The O vacancies at the surfaces of ZnO NWs and around the interface of Ti/ZnO NWs observed using X-ray phototelectron spectroscopy, transmission electron microscopy (TEM), selected-area electron diffraction, and high-resolution TEM might play a role in the resistive switching behavior. The endurance of resistive switching can be enhanced by further increasing the sweeping voltage. This paper brings an exciting possibility of building next-generation memory devices based on NWs.
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Resistive switching in transition metal oxides
Akihito Sawa · Materials Today · 2008 · 2.9K citations · Full text
The physics of semiconductor devices
H. L. Grubin · IEEE Journal of Quantum Electronics · 1979 · 2.8K citations
<i>Electrical Transport in Solids</i>
K. C. Kao, W-J Hwang, Sang-Il Choi · Physics Today · 1983 · 796 citations
Natural Sciences, Electrical Engineering, Materials Science +12