Single-ZnO-Nanowire Memory

Yen-De Chiang, Wen-Yuan Chang, Ching-Yuan Ho, Cheng–Ying Chen, Chih‐Hsiang Ho, Su-Jien Lin, Tai-Bor Wu, Jr‐Hau He

IEEE Transactions on Electron Devices · 2011 · 78 citations · 39 references

Concepts

Abstract

Single-ZnO-nanowire (NW) memory based on resistive switching is demonstrated for the first time. The NW memory is stable, rewritable, and nonvolatile with on/off ratio up to 7.7 × 10 <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">5</sup> . The O vacancies at the surfaces of ZnO NWs and around the interface of Ti/ZnO NWs observed using X-ray phototelectron spectroscopy, transmission electron microscopy (TEM), selected-area electron diffraction, and high-resolution TEM might play a role in the resistive switching behavior. The endurance of resistive switching can be enhanced by further increasing the sweeping voltage. This paper brings an exciting possibility of building next-generation memory devices based on NWs.

References

39