Publication | Closed Access
Concentration mapping—a software package for the quantitative determination of two‐dimensional elemental distribution by an electron probe microanalyser
12
Citations
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References
1985
Year
EngineeringMicroscopyQuantitative DeterminationDigital Mapping TechniquesChemistryChemical EngineeringElectron MicroscopyAnalytical InstrumentationElectron SpectroscopyCalibrationAnalytical ChemistryInstrumentationElemental CharacterizationTwo‐dimensional Elemental DistributionPhysicsMicroanalysisCm InvestigationsElectron Probe MicroanalyserNatural SciencesSpectroscopyMass SpectrometryApplied PhysicsElectron MicroscopeConcentration Mapping
Abstract Developments starting from known digital mapping techniques led to a powerful and versatile software package, Concentration Mapping (CM), the advantages of which over former programs are as follows: up to 18 elements can be measured; correction calculations can be applied to obtain quantitative results; additional information may be obtained by further data processing; several programs for special data readout, phase analysis and statistical calculations are available; a very efficient automation system makes extended investigations practicable in an economical manner. Some examples of applications are given to demonstrate the extensive information from CM investigations which could not be achieved easily with customary electron probe microanalysis systems.
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