Nanoimaging of Open‐Circuit Voltage in Photovoltaic Devices

Abstract

A novel imaging platform to determine the open-circuit voltage of solar cells with nanoscale spatial resolution is presented. Here, a variant of illuminated Kelvin probe force microscopy can be implemented to quantify local variations in the voltage of different solar cells. The new metrology can be applied to any optoelectronic device, and works in ambient environments. As a service to our authors and readers, this journal provides supporting information supplied by the authors. Such materials are peer reviewed and may be re-organized for online delivery, but are not copy-edited or typeset. Technical support issues arising from supporting information (other than missing files) should be addressed to the authors. Please note: The publisher is not responsible for the content or functionality of any supporting information supplied by the authors. Any queries (other than missing content) should be directed to the corresponding author for the article.