Worst-Case Induced Disturbances in Digital and Analog Interchip Interconnects by an External Electromagnetic Plane Wave—Part I: Modeling and Algorithm

Abstract

This paper deals with the susceptibility of electronic units to radiated electromagnetic (EM) interference and specifically, it focuses on the parasitic coupling of EM fields with printed circuit board interconnects like microstrip lines. To this purpose, a uniform lossless microstrip line illuminated by an EM plane wave is considered and the voltages at the line terminations are evaluated referring to the Baum-Liu-Tesche equations. Based on this, a new algorithm to identify, frequency-by-frequency, the incidence angles and the polarization of the impinging field that gives rise to the maximum induced voltages at the line terminations is presented.