IEEE Transactions on Electron Devices · 2008 · 134 citations · 21 references
EngineeringElectrical EngineeringMicroelectronicsSemiconductor DevicesSemiconductor MaterialsCarrier TransportCharge Carrier TransportCurrent-voltage CharacteristicsDevice ModelingField-effect TransistorsSemiconductor PhysicsCarrier Mobility ModelingCharge ControlConductancePolarization EffectsRobin Boundary ConditionsSaturation RegionThreshold VoltageVelocity Saturation
A threshold-voltage-based 2-D analytical model for the current-voltage characteristics of the AlGaN/GaN modulation-doped field-effect transistors (MODFETs) is presented. In this paper, the conventional charge-control model is improved by employing the Robin boundary condition when solving the 1-D Schrodinger equation in the low longitudinal-field region and introducing an adjustable eigenvalue during the solution of the 2-D Poisson's equation in the velocity-saturation region. A modified Polyakov-Schwierz mobility model, as well s a low-field mobility model, has been developed. In addition, the nonlinear polarization effects at the AlGaN/GaN interface and the parasitic source/drain resistances are incorporated. Our model predicts the drain current of a second-order continuity, and both the transconductance and output conductance can be determined analytically. We validate the model with experimental data for and MODFETs, respectively, and obtained good agreements.
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GaAs FET device and circuit simulation in SPICE
H. Statz, P. G. Newman, I. W. Smith et al. · IEEE Transactions on Electron Devices · 1987 · 518 citations
High Al-content AlGaN/GaN MODFETs for ultrahigh performance
Yifeng Wu, B.P. Keller, P. Fini et al. · IEEE Electron Device Letters · 1998 · 280 citations
Bias dependent microwave performance of AlGaN/GaN MODFET's up to 100 V
Yifeng Wu, S. Keller, P. Kozodoy et al. · IEEE Electron Device Letters · 1997 · 181 citations