Highly scalable STT-MRAM with MTJs of top-pinned structure in 1T/1MTJ cell

Young Min Lee, Chikakko Yoshida, Koji Tsunoda, Shinjiro Umehara, Masaki Aoki, Toshihiro Sugii

2010 · 24 citations · 3 references

Concepts

Abstract

We report on spin transfer torque magnetoresistance random access memory (STT-MRAM) with magnetic tunnel junctions (MTJs) that have a top-pinned stacking structure. By adopting the top-pinned structure, in which a pinned layer and an antiferromagnetic layer are deposited above the MgO tunnel barrier, we can relieve the current limitation caused by driving power asymmetry of the transistor in a 1T/1M structure without an additional current path to make a reverse connection between the transistor and the top side of the MTJs, resulting in the cell area being reduced by about half.

References

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