2003 · 53 citations · 8 references
EngineeringElectrical EngineeringAnalog ElectronicsMicroelectronicsPerformance MeasurementAnalog InstrumentationDc-dc ConversionDevice CharacterizationDigital Signal ProcessingFrequency-domain AnalysisSpectral AnalysisA-d ConversionAnalog-to-digital ConversionAnalog-to-digital ConvertersData ProcessingFrequency Domain ProcessingPrecision Measurement
An analysis of the frequency domain approach in the test of analog-to-digital convertors (ADCs) is presented. Following the introduction of a spectral analysis algorithm based on the use of windows with minimum sidelobe energy, expressions are given to determine ADC performance parameters. Corrections are introduced to improve accuracy in practical cases, and simulation results are presented to support the discussion. The approach presented is sufficiently precise in the characterization of a device, even with data records of comparatively small size. Provided the appropriate correction factors are taken into account in some determinations, the accuracy is not dissimilar to that of other test methods, with the advantage that both data acquisition and data processing procedures are fairly simple.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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