Publication | Open Access
Resonant scattering of energetic electrons by unusual low-frequency hiss
146
Citations
23
References
2014
Year
EngineeringPhysicsElectron SpectroscopyVan Allen ProbesPlasma TheoryApplied PhysicsEnergetic ElectronsAtomic PhysicsPlasma SciencePlasma PhysicsElectron DiffractionIntense InjectionsPlasma ConfinementUnusual HissPlasma Diagnostics
We quantify the resonant scattering effects of the unusual low-frequency dawnside plasmaspheric hiss observed on 30 September 2012 by the Van Allen Probes. In contrast to normal (~100–2000 Hz) hiss emissions, this unusual hiss event contained most of its wave power at ~20–200 Hz. Compared to the scattering by normal hiss, the unusual hiss scattering speeds up the loss of ~50–200 keV electrons and produces more pronounced pancake distributions of ~50–100 keV electrons. It is demonstrated that such unusual low-frequency hiss, even with a duration of a couple of hours, plays a particularly important role in the decay and loss process of energetic electrons, resulting in shorter electron lifetimes for ~50–400 keV electrons than normal hiss, and should be carefully incorporated into global modeling of radiation belt electron dynamics during periods of intense injections.
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