Single-scan interferometric component analyzer

Abstract

We describe a novel interferometric method for characterizing optical components in the 1.5-μm communications band. A complete polarization-resolved characterization of optical components is achieved with just one scan of a tunable laser. Measurements of three devices are presented, including a molecular gas cell, an arrayed waveguide grating, and a tunable dispersion compensator. A dynamic range of greater than 80 dB is demonstrated.