Measurement of the dielectric constant and loss tangent of high dielectric-constant materials at terahertz frequencies

P. Haring Bolívar, M. Brucherseifer, Jaime Gómez Rivas, R. Gonzalo, Íñigo Ederra, A.L. Reynolds, M. Holker

IEEE Transactions on Microwave Theory and Techniques · 2003 · 218 citations · 13 references

Concepts

TL;DR

The study envisions using these materials as photonic crystal substrates for terahertz antennas. The authors measured dielectric properties of low‑loss high‑dielectric materials in the terahertz range with time‑domain spectroscopy. The dielectric constant of the tested materials ranged from 6 to 90 with low loss tangents, and their values were compared to high‑resistivity silicon.

Abstract

Low-loss high dielectric-constant materials are analyzed in the terahertz frequency range using time-domain spectroscopy. The dielectric constant and loss tangent for steatite, alumina, titania loaded polystyrene, and zirconium-tin-titanate are presented and compared to measurements on high-resistivity silicon. For these materials, the real part of the dielectric constant ranges from 6 to 90. All of the samples were found to have reasonable low-loss tangents. Applications as photonic crystal substrates for terahertz frequency antenna are envisaged.

References

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