Publication | Closed Access
Burnout sensitivity of power MOSFETs operating in a switching converter
12
Citations
6
References
1994
Year
Burnout SensitivityElectrical EngineeringEngineeringHigh Voltage EngineeringEnergy EfficiencyPower DeviceSwitching ConverterPower Electronics ConverterPower Semiconductor DeviceCircuit ReliabilityPower Electronic SystemsPower ElectronicsPower-aware DesignPower Electronic DevicesHeavy Ion Tests
Heavy ion tests of a switching converter using power MOSFETs have allowed us to identify the main parameters which affect the burnout sensitivity of these components. The differences between static and dynamic conditions are clarified in this paper.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
| Year | Citations | |
|---|---|---|
Page 1
Page 1