Publication | Closed Access
Using VFTLP data to design for CDM robustness
20
Citations
1
References
2009
Year
Unknown Venue
Electrical EngineeringReliability EngineeringEngineeringCdm RobustnessHigh Speed MeasurementTransient BehaviorUncertainty QuantificationCdm PerformanceRobust StatisticAnalog-to-digital ConverterManagementComputer EngineeringRobustness TestingSystems EngineeringRobustness (Computer Science)Modeling And SimulationSignal ProcessingData Modeling
In this paper, transient behavior of DTSCRs is captured and analyzed using high speed measurement with VFTLP. It is possible to use this data to properly design for CDM performance of final product while maximizing performance.
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