Analysis of signal to noise ratio of photoconductive layered solid-state imaging device

Abstract

The signal to noise ratio of the photoconductive layered solid-state imaging device (PSID) has been theoretically derived. In this analysis the noise suppression effect due to residual signal electrons in the storage diode after read-out operation, the optical shot noise, and the fluctuation of the number of transferred signal electrons due to incomplete readout signal electrons were considered. The obtained result showed good agreement to the experimental result.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">&gt;</ETX>