Designing fault-tolerant techniques for SRAM-based FPGAs

Abstract

FPGAs have become prevalent in critical applications in which transient faults can seriously affect the circuit's operation. We present a fault tolerance technique for transient and permanent faults in SRAM-based FPGAs. This technique combines duplication with comparison (DWC) and concurrent error detection (CEO) to provide a highly reliable circuit while maintaining hardware, pin, and power overheads far lower than with classic triple-modular-redundancy techniques.