Publication | Closed Access
SiC Wirebond Multi-Chip Phase-Leg Module Packaging Design and Testing for Harsh Environment
16
Citations
22
References
2009
Year
Unknown Venue
Thermo-mechanical Reliability EvaluationElectrical EngineeringSic DevicesEngineeringHigh Junction TemperaturePower DeviceChip-scale PackageAdvanced Packaging (Semiconductors)Chip On BoardMechanical EngineeringPower Semiconductor DeviceChip AttachmentHarsh EnvironmentElectronic PackagingPower ElectronicsMicroelectronicsThermal EngineeringHeat Transfer
In order to take full advantage of SiC, a high temperature wirebond package for multi-chip phase-leg power module using SiC devices was designed, developed, fabricated and tested. The details of the material selection and thermo-mechanical reliability evaluation are described. High temperature power test shows that the package presented in this paper can perform well at the high junction temperature.
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