The termination of the α-Al2O3 (0001) surface: a LEED crystallography determination

<i>International Tables for X-ray Crystallography</i>

Acta Crystallographica Section B · 1976 · 14.2K citations · Full text

Natural Sciences, Chemistry, Materials Science +11

Rietveld refinement of Debye–Scherrer synchrotron X-ray data from Al₂O₃

Paul Thompson, D. E. Cox, J. B. Hastings · Journal of Applied Crystallography · 1987 · 2.7K citations

Natural Sciences, Materials Engineering, Materials Science +17

Optimization of the Statistical Exchange Parameter<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mi>α</mml:mi></mml:math>for the Free Atoms H through Nb

Karlheinz Schwarz · Physical review. B, Solid state · 1972 · 1.2K citations

Natural Sciences, Chemistry, Physics +17

Reliability factors for LEED calculations

J. B. Pendry · Journal of Physics C Solid State Physics · 1980 · 1.1K citations

Education, Chemistry, Scientific Computing +1

Theory of polar semiconductor surfaces

Walter A. Harrison · Journal of Vacuum Science and Technology · 1979 · 294 citations

Natural Sciences, Materials Science, Physics +17