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Electrical resistivity of polycrystalline bismuth films
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1974
Year
Materials EngineeringMaterials ScienceSemiconductorsSize Effect TheoryEngineeringElectronic MaterialsSpecific ResistanceMaterial AnalysisCondensed Matter PhysicsApplied PhysicsSemiconductor MaterialThin Film Process TechnologyThin FilmsPolycrystalline Bismuth FilmsElectrical PropertyElectrical Resistivity
Electrical resistivity of polycrystalline bismuth films was studied. The size effect theory in addition to the grain boundary scattering theory of Mayadas and Shatzkes has been applied to the data to explain resistivity—thickness dependence.