Concepedia

Applying grazing incidence X-ray reflectometry (XRR) to characterising nanofilms on mica

Wuge H. Briscoe, Meng Chen, Iain E. Dunlop, Jacob Klein, J. Penfold, Robert M. J. Jacobs

Journal of Colloid and Interface Science · 2006 · 35 citations · 17 references

Concepts

Materials ScienceIncidence X-ray ReflectometryX-ray SpectroscopyEngineeringMicroscopyNanotechnologyOptical PropertiesSurface ScienceNanomaterialsMaterials CharacterizationApplied PhysicsMicroanalysisX-ray DiffractionNanometrologyNanofabricationMedicineBiophysicsX-ray Fluorescence

References

17

Surface Studies of Solids by Total Reflection of X-Rays

L. G. Parratt · Physical Review · 1954 · 5.1K citations

X-ray Spectroscopy, Engineering, Optical Glass +17

<i>Principles of Optics: Electromagnetic Theory of Propagation, Interference and Diffraction of Light</i>

Max Born, Emil Wolf, Eugene Hecht · Physics Today · 2000 · 4.1K citations

Optical Materials, Engineering, Wave Optic +21

Principles of optics. Electromagnetic theory of propagation, interference and diffraction of light

L. Rosenfeld · Nuclear Physics · 1960 · 3.3K citations

Electromagnetic Wave, Photonics, Engineering +14

Direct measurement of colloidal forces using an atomic force microscope

William A. Ducker, Tim J. Senden, Richard M. Pashley · Nature · 1991 · 2K citations

Materials Science, Colloidal Material, Physics +8

Structure and Conformational Changes in NSF and Its Membrane Receptor Complexes Visualized by Quick-Freeze/Deep-Etch Electron Microscopy

Phyllis I. Hanson, Robyn Roth, Hiroshi Morisaki et al. · Cell · 1997 · 790 citations · Full text