Concepedia

Publication | Open Access

Secondary electron yield measurements of carbon covered multilayer optics

DOIFull Paper Access

26

Citations

32

References

2010

Year

Juequan Chen, Eric Louis, J. Verhoeven, Rob Harmsen, Chris Lee, Monika Lubomska, M. van Kampen, Willem van Schaik, F. Bijkerk
Applied Surface Science

References

YearCitations

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