Particle analyzer system based on microwave-induced plasma technology

Abstract

We have developed a new particle analyzing system, the PT1000, the world's first such system based on microwave-induced plasma (MIP) technology. This system provides three-dimensional information: the composition and size of each particulate, and their number and distribution. The measuring principle is that particulates collected on the filter are introduced in turn into the center of the high-temperature, atmospheric pressure He-MIP by an aspirator, evaporated instantaneously and atomized, ionized, then further excited. The emission spectrum accompanying this excitation enters four spectroscopes through optical fibers. Elements in the particulates are determined from the wave lengths set on the spectroscopes, the number of particulates from the number of peaks, the particle size from the peak height, and the composition from the synchronizing emission.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">&gt;</ETX>