IEEE Photonics Technology Letters · 1997 · 76 citations · 8 references
EngineeringElectrical EngineeringPhotonicsSemiconductor DevicesSpatial StatisticsIntegrated PhotonicsLaser DiodesNoise In Semiconductor DevicesOptical Properties Of SemiconductorsPhotonic Integrated CircuitsSemiconductor LasersCarrier DiffusionLasersLow-frequency NoiseNoise CharacteristicsRelaxation OscillationsSingle-mode LasersSingle-mode OperationVertical-cavity Surface-emitting Lasers
We present a numerical study of the effects of carrier diffusion and spatial hole-burning on the noise characteristics of vertical-cavity surface-emitting lasers (VCSEL's) under both single-mode and multimode operations. In the case of single-mode operation, VCSEL noise characteristics are similar to those of edge-emitting lasers except for a diffusion-induced damping of relaxation oscillations. Under multimode operation, VCSEL's exhibit low-frequency noise enhancement due to mode partition. However, depending on the spatial distributions of the transverse modes excited, the mode-partition noise characteristics can be quite different.
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