Electromigrated molecular junctions

Abstract

Abstract We report on the fabrication and characterization of molecular junctions which are fabricated with electromigration and subsequent trapping of the molecule from solution. Transport measurements show molecule‐specific features (vibrational modes; gate coupling) and indicate the presence of a single molecule in the gap. Electromigrated junctions can be very stable and allow for temperature dependent measurements, which provide, next to gate dependent measurements, an additional tool to perform detailed studies of transmolecular conduction mechanisms. (© 2006 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)