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Free-standing Single Crystal Silicon Nanoribbons
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EngineeringCrystal Growth TechnologyAltmetric Attention ScoreSolid-state ChemistryChemistrySilicon On InsulatorHong KongSiliceneNanoscale ScienceMaterials ScienceHong Kong SarPhysicsCrystalline DefectsNanotechnologyCrystal MaterialCrystallographyElectronic MaterialsFlexible ElectronicsMicrofabricationNatural SciencesApplied PhysicsNano Electro Mechanical System
ADVERTISEMENT RETURN TO ISSUEPREVCommunicationNEXTFree-standing Single Crystal Silicon NanoribbonsWensheng Shi, Hongying Peng, Ning Wang, Chi Pui Li, Lu Xu, Chun Sing Lee, Rafi Kalish, and Shuit-Tong LeeView Author Information Center Of Super-Diamond and Advanced Films (COSDAF) and the Department of Physics and Materials City University of Hong Kong, Hong Kong SAR, China Cite this: J. Am. Chem. Soc. 2001, 123, 44, 11095–11096Publication Date (Web):October 11, 2001Publication History Received28 May 2001Published online11 October 2001Published inissue 1 November 2001https://pubs.acs.org/doi/10.1021/ja0162966https://doi.org/10.1021/ja0162966rapid-communicationACS PublicationsCopyright © 2001 American Chemical SocietyRequest reuse permissionsArticle Views1316Altmetric-Citations143LEARN ABOUT THESE METRICSArticle Views are the COUNTER-compliant sum of full text article downloads since November 2008 (both PDF and HTML) across all institutions and individuals. These metrics are regularly updated to reflect usage leading up to the last few days.Citations are the number of other articles citing this article, calculated by Crossref and updated daily. Find more information about Crossref citation counts.The Altmetric Attention Score is a quantitative measure of the attention that a research article has received online. Clicking on the donut icon will load a page at altmetric.com with additional details about the score and the social media presence for the given article. Find more information on the Altmetric Attention Score and how the score is calculated. Share Add toView InAdd Full Text with ReferenceAdd Description ExportRISCitationCitation and abstractCitation and referencesMore Options Share onFacebookTwitterWechatLinked InRedditEmail Other access optionsGet e-AlertscloseSupporting Info (1)»Supporting Information Supporting Information SUBJECTS:Crystallization,Oxides,Silicon,Thickness,Two dimensional materials Get e-Alerts
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