An investigation of the critical thickness of film rupture and drainage phenomena using dual wavelength ellipsometry - Concepedia

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An investigation of the critical thickness of film rupture and drainage phenomena using dual wavelength ellipsometry

17

Citations

14

References

1998

Year

D. G. Goodall, Michelle L. Gee, Geoffrey W. Stevens, Jude Shalitha Perera, D. Beaglehole

Colloids and Surfaces A Physicochemical and Engineering Aspects

Materials ScienceEngineeringSurface ScienceApplied PhysicsDual Wavelength EllipsometryRheologyFilm RuptureThin FilmsDrainage PhenomenaPhotoelasticityThin Film Processing

References

	Year	Citations

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