Electrochemical and Solid-State Letters · 2010 · 67 citations · 17 references
EngineeringMaterials EngineeringMaterials ScienceElectronic MaterialsSemiconductor MaterialsThin FilmsAmorphous SemiconductorsSemiconductor Device MaterialsSemiconductor Thin FilmsThin Film Electrical PropertiesThin-film MaterialsThin-film TransistorsAmorphous Indium Gallium Zinc OxideAmorphous Oxide SemiconductorsAmorphous Thin FilmsOxide Thin-film TransistorsSubthreshold SwingSubthreshold Swing AnalysisThin Oxide FilmsThreshold Voltage
The original influence of water on the back-channel of sol–gel derived amorphous indium–gallium–zinc-oxide thin film transistors was studied in various relative humidity environments. As humidity increased from 0 to 80%, the mobility increased from , threshold voltage decreased from , and subthreshold swing changed from . The conflicting phenomenon among the three parameters was suggested to be due to a division of the gate voltage by the water molecules which adsorbed on the thin film transistor back-channel and acted as dipoles.
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Thin-Film Transistor Fabricated in Single-Crystalline Transparent Oxide Semiconductor
Kenji Nomura, Hiromichi Ohta, Kazushige Ueda et al. · Science · 2003 · 1.9K citations
Interactions of tin oxide surface with O2, H2O AND H2
Noboru Yamazoe, Jun Fuchigami, Masato Kishikawa et al. · Surface Science · 1979 · 833 citations
Natural Sciences, Materials Engineering, Materials Science +14