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Effect of External Stress Applied during Annealing on Hydrogen- and Oxygen-Implanted Silicon

A. Misiuk, Hańcza B. Surma, I. V. Antonova, V. P. Popov, J. Bąk‐Misiuk, M. López, A. Romano‐Rodrı́guez, A. Barcz, J. Jun

Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena · 1999 · 20 citations · 0 references

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