Publication | Closed Access
Characteristics of the low electron density surface layer on BaTiO3 thin films
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Citations
18
References
2008
Year
EngineeringX-ray ReflectivityThin Film Process TechnologyUnderneath Batio3 LayerMolecular Beam EpitaxyEpitaxial GrowthBatio3 Thin FilmsThin Film ProcessingMaterials ScienceElectron DensityOxide HeterostructuresCrystalline DefectsOxide ElectronicsLow Electron DensitySurface CharacterizationMaterial AnalysisSurface ScienceApplied PhysicsThin Films
The surfaces of epitaxial BaTiO3 films on SrTiO3 substrates were investigated by x-ray reflectivity (XRR) and angle-resolved x-ray photoelectron spectroscopy (ARXPS). It was shown by XRR analysis that there exists a low electron density surface layer (about 87%–93% of the electron density of the underneath BaTiO3 layer) of 15Å on top of the film. Moreover, ARXPS results revealed a surface core-level shift of Ba in layer of about 11Å, a value which is in agreement with the thickness obtained by XRR, indicating that the surface core-level shift of Ba stems from the low electron density surface layer.
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