Publication | Closed Access
Light–Output Enhancement of Nano-Roughened GaN Laser Lift-Off Light-Emitting Diodes Formed by ICP Dry Etching
38
Citations
11
References
2007
Year
EngineeringLaser ApplicationsSemiconductor LasersNanoelectronicsLight–output EnhancementElectrical EngineeringPhotoluminescenceIcp Dry EtchingNano-scaled RoughnessSurface RoughnessNew Lighting TechnologyAluminum Gallium NitrideMicroelectronicsPlasma EtchingSolid-state LightingLlo LedApplied PhysicsGan Power DeviceOptoelectronics
In this paper, we report the fabrication and characteristics of nano-roughened GaN laser lift-off (LLO) light-emitting diodes (LEDs) with different scale surface roughness. The surface roughness of devices was controlled by inductively coupled plasma reactive ion etching. Using this fabrication method to form nano-scaled roughness, the electrical property was almost not degraded. Furthermore, the light-output power and wall-plug efficiency of LLO LED could be both significantly enhanced about two times using this simple method
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