Publication | Open Access
Nanoscale x-ray absorption spectroscopy using XEOL-SNOM detection mode
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Citations
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References
2007
Year
Materials ScienceX-ray SpectroscopyXeol-snom Detection ModePhysicsEngineeringOptical PropertiesSpectroscopySurface ScienceApplied PhysicsSynchrotron Beamline Id03Natural SciencesX-ray DiffractionOxide ElectronicsSynchrotron Radiation SourceThin FilmsElement-specific ContrastFirst Results
The first results obtained with the prototype system at the synchrotron beamline ID03 at ESRF are presented and illustrate the possibility to detect an element-specific contrast and to perform nanoscale x-ray absorption spectroscopy experiments at the Zn K and W L3 absorption edges in mixed zinc oxide-zinc tungstate thin films.
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