Measuring resistance standards in terms of the quantized hall resistance with a dual josephson voltage standard using sinis josephson arrays

Abstract

To determine arbitrary resistance ratios with high precision, a measuring system based on a dual Josephson voltage standard has been set up. It is demonstrated that, by means of this system, 10-k/spl Omega/ standard resistors can be linked to a quantized Hall resistance (i=2, 12.9 k/spl Omega/) with an expanded uncertainty (k=2) of less than 4 parts in 10/sup 9/.